JPH0265175U - - Google Patents
Info
- Publication number
- JPH0265175U JPH0265175U JP14448688U JP14448688U JPH0265175U JP H0265175 U JPH0265175 U JP H0265175U JP 14448688 U JP14448688 U JP 14448688U JP 14448688 U JP14448688 U JP 14448688U JP H0265175 U JPH0265175 U JP H0265175U
- Authority
- JP
- Japan
- Prior art keywords
- temperature
- package
- memory
- section
- test
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000007689 inspection Methods 0.000 claims 2
- 238000010586 diagram Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14448688U JPH0265175U (en]) | 1988-11-04 | 1988-11-04 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14448688U JPH0265175U (en]) | 1988-11-04 | 1988-11-04 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH0265175U true JPH0265175U (en]) | 1990-05-16 |
Family
ID=31412241
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14448688U Pending JPH0265175U (en]) | 1988-11-04 | 1988-11-04 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0265175U (en]) |
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1988
- 1988-11-04 JP JP14448688U patent/JPH0265175U/ja active Pending